Electrical parameters degradation of power RF LDMOS device after accelerated ageing tests

M. A. Belaïd, K. Ketata, M. Masmoudi, M. Gares, H. Maanane, J. Marcon. Electrical parameters degradation of power RF LDMOS device after accelerated ageing tests. Microelectronics Reliability, 46(9-11):1800-1805, 2006. [doi]

Abstract

Abstract is missing.