Leakage current effects on N-MOSFETs after thermal ageing in pulsed life tests

M. A. Belaïd, A. M. Nahhas, M. Gares, K. Daoud, O. Latry. Leakage current effects on N-MOSFETs after thermal ageing in pulsed life tests. Microelectronics Journal, 45(12):1800-1805, 2014. [doi]

Abstract

Abstract is missing.