Leakage current effects on N-MOSFETs after thermal ageing in pulsed life tests

M. A. Belaïd, A. M. Nahhas, M. Gares, K. Daoud, O. Latry. Leakage current effects on N-MOSFETs after thermal ageing in pulsed life tests. Microelectronics Journal, 45(12):1800-1805, 2014. [doi]

@article{BelaidNGDL14,
  title = {Leakage current effects on N-MOSFETs after thermal ageing in pulsed life tests},
  author = {M. A. Belaïd and A. M. Nahhas and M. Gares and K. Daoud and O. Latry},
  year = {2014},
  doi = {10.1016/j.mejo.2014.06.002},
  url = {http://dx.doi.org/10.1016/j.mejo.2014.06.002},
  researchr = {https://researchr.org/publication/BelaidNGDL14},
  cites = {0},
  citedby = {0},
  journal = {Microelectronics Journal},
  volume = {45},
  number = {12},
  pages = {1800-1805},
}