Yasmina Belaroussi, Abdelhalim Slimane, Mohand-Tahar Belaroussi, Mohamed Trabelsi, Gilles Scheen, Khaled Ben Ali, Jean-Pierre Raskin. RF and non-linearity characterization of porous silicon layer for RF-ICs. In 9th International Design and Test Symposium, IDT 2014, Algeries, Algeria, December 16-18, 2014. pages 79-82, IEEE, 2014. [doi]
Abstract is missing.