V. V. Belkin, S. G. Sharshunov. ISA Based Functional Test Generation with Application to Self-Test of RISC Processors. In Matteo Sonza Reorda, Ondrej Novák, Bernd Straube, Hana Kubatova, Zdenek Kotásek, Pavel Kubalík, Raimund Ubar, Jiri Bucek, editors, Proceedings of the 9th IEEE Workshop on Design & Diagnostics of Electronic Circuits & Systems (DDECS 2006), Prague, Czech Republic, April 18-21, 2006. pages 75-76, IEEE Computer Society, 2006.
Abstract is missing.