Catherine Bellon, A. Liothin, S. Sadier, Gabriele Saucier, Raoul Velazco, Francois Grillot, M. Issenman. Automatic generation of microprocessor test programs. In James S. Crabbe, Charles E. Radke, Hillel Ofek, editors, Proceedings of the 19th Design Automation Conference, DAC '82, Las Vegas, Nevada, USA, June 14-16, 1982. pages 566-573, ACM/IEEE, 1982. [doi]
Abstract is missing.