Maciej Bellos, Dimitris Bakalis, Dimitris Nikolos, Xrysovalantis Kavousianos. Low Power Testing by Test Vector Ordering with Vector Repetition. In 5th International Symposium on Quality of Electronic Design (ISQED 2004), 22-24 March 2004, San Jose, CA, USA. pages 205-210, IEEE Computer Society, 2004. [doi]
Abstract is missing.