Giovanni Beltrame, Cristiana Bolchini, Luca Fossati, Antonio Miele, Donatella Sciuto. A Framework for Reliability Assessment and Enhancement in Multi-Processor Systems-On-Chip. In Cristiana Bolchini, Yong-Bin Kim, Adelio Salsano, Nur A. Touba, editors, 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007), 26-28 September 2007, Rome, Italy. pages 132-141, IEEE Computer Society, 2007. [doi]
Abstract is missing.