Testing of embedded A/D converters in mixed-signal circuit

Naim Ben Hamida, Bechir Ayari, Bozena Kaminska. Testing of embedded A/D converters in mixed-signal circuit. In 1996 International Conference on Computer Design (ICCD 96), VLSI in Computers and Processors, October 7-9, 1996, Austin, TX, USA, Proceedings. pages 135-136, IEEE Computer Society, 1996. [doi]

Abstract

Abstract is missing.