Topological and statistical behavior classifiers for tracking applications

Paul Bendich, Sang Peter Chin, Jesse Clark, Jonathan DeSena, John Harer, Elizabeth Munch, Andrew Newman, David Porter, David Rouse, Nate Strawn, Adam Watkins. Topological and statistical behavior classifiers for tracking applications. IEEE Trans. Aerospace and Electronic Systems, 52(6):2644-2661, 2016. [doi]

Abstract

Abstract is missing.