Comparing Exhaustive and Random Fault Injection Methods for Configuration Memory on SRAM-based FPGAs

Fabio Benevenuti, Fernanda Lima Kastensmidt. Comparing Exhaustive and Random Fault Injection Methods for Configuration Memory on SRAM-based FPGAs. In IEEE Latin American Test Symposium, LATS 2019, Santiago, Chile, March 11-13, 2019. pages 1-6, IEEE, 2019. [doi]

Abstract

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