Empirical Evaluation of Cross-Release Effort-Aware Defect Prediction Models

Kwabena Ebo Bennin, Koji Toda, Yasutaka Kamei, Jacky Keung, Akito Monden, Naoyasu Ubayashi. Empirical Evaluation of Cross-Release Effort-Aware Defect Prediction Models. In 2016 IEEE International Conference on Software Quality, Reliability and Security, QRS 2016, Vienna, Austria, August 1-3, 2016. pages 214-221, IEEE, 2016. [doi]

Abstract

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