Characterization of conducted emission at high frequency under different temperature

N. Berbel, Raúl Fernández-García, Ignacio Gil. Characterization of conducted emission at high frequency under different temperature. In 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits, EMC Compo 2013, Nara, Japan, December 15-18, 2013. pages 147-151, IEEE, 2013. [doi]

Abstract

Abstract is missing.