N. Berbel, Raúl Fernández-García, Ignacio Gil. Characterization of conducted emission at high frequency under different temperature. In 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits, EMC Compo 2013, Nara, Japan, December 15-18, 2013. pages 147-151, IEEE, 2013. [doi]
@inproceedings{BerbelFG13,
title = {Characterization of conducted emission at high frequency under different temperature},
author = {N. Berbel and Raúl Fernández-García and Ignacio Gil},
year = {2013},
doi = {10.1109/EMCCompo.2013.6735190},
url = {https://doi.org/10.1109/EMCCompo.2013.6735190},
researchr = {https://researchr.org/publication/BerbelFG13},
cites = {0},
citedby = {0},
pages = {147-151},
booktitle = {9th International Workshop on Electromagnetic Compatibility of Integrated Circuits, EMC Compo 2013, Nara, Japan, December 15-18, 2013},
publisher = {IEEE},
}