Bandwidth Analysis for Reusing Functional Interconnect as Test Access Mechanism

Ardy van den Berg, Pengwei Ren, Erik Jan Marinissen, Georgi Gaydadjiev, Kees Goossens. Bandwidth Analysis for Reusing Functional Interconnect as Test Access Mechanism. In 13th European Test Symposium (ETS 2008), May 25-29, 2008, Verbania, Italy. pages 21-26, IEEE Computer Society, 2008. [doi]

Abstract

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