Kelvin probe force microscopy - An appropriate tool for the electrical characterisation of LED heterostructures

W. Bergbauer, T. Lutz, Werner Frammelsberger, Guenther Benstetter. Kelvin probe force microscopy - An appropriate tool for the electrical characterisation of LED heterostructures. Microelectronics Reliability, 46(9-11):1736-1740, 2006. [doi]

Authors

W. Bergbauer

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T. Lutz

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Werner Frammelsberger

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Guenther Benstetter

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