Paolo Bernardi, Riccardo Cantoro, L. Gianotto, M. Restifo, Ernesto Sánchez, F. Venini, Davide Appello. A DMA and CACHE-based stress schema for burn-in of automotive microcontroller. In 18th IEEE Latin American Test Symposium, LATS 2017, Bogotá, Colombia, March 13-15, 2017. pages 1-6, IEEE, 2017. [doi]
Abstract is missing.