Paolo Bernardi, Matteo Sonza Reorda, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch. On the Modeling of Gate Delay Faults by Means of Transition Delay Faults. In 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2011, Vancouver, BC, Canada, October 3-5, 2011. pages 226-232, IEEE, 2011. [doi]
Abstract is missing.