Performance and reliability of strained SOI transistors for advanced planar FDSOI technology

G. Besnard, Xavier Garros, A. Subirats, Fran├žois Andrieu, X. Federspiel, M. Rafik, W. Schwarzenbach, Gilles Reimbold, Olivier Faynot, Sorin Cristoloveanu. Performance and reliability of strained SOI transistors for advanced planar FDSOI technology. In IEEE International Reliability Physics Symposium, IRPS 2015, Monterey, CA, USA, April 19-23, 2015. pages 2, IEEE, 2015. [doi]

@inproceedings{BesnardGSAFRSRF15,
  title = {Performance and reliability of strained SOI transistors for advanced planar FDSOI technology},
  author = {G. Besnard and Xavier Garros and A. Subirats and Fran├žois Andrieu and X. Federspiel and M. Rafik and W. Schwarzenbach and Gilles Reimbold and Olivier Faynot and Sorin Cristoloveanu},
  year = {2015},
  doi = {10.1109/IRPS.2015.7112691},
  url = {http://dx.doi.org/10.1109/IRPS.2015.7112691},
  researchr = {https://researchr.org/publication/BesnardGSAFRSRF15},
  cites = {0},
  citedby = {0},
  pages = {2},
  booktitle = {IEEE International Reliability Physics Symposium, IRPS 2015, Monterey, CA, USA, April 19-23, 2015},
  publisher = {IEEE},
  isbn = {978-1-4673-7362-3},
}