C. Bestory, F. Marc, H. Levi. Statistical analysis during the reliability simulation. Microelectronics Reliability, 47(9-11):1353-1357, 2007. [doi]
@article{BestoryML07,
title = {Statistical analysis during the reliability simulation},
author = {C. Bestory and F. Marc and H. Levi},
year = {2007},
doi = {10.1016/j.microrel.2007.07.079},
url = {http://dx.doi.org/10.1016/j.microrel.2007.07.079},
tags = {analysis, C++, reliability},
researchr = {https://researchr.org/publication/BestoryML07},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {47},
number = {9-11},
pages = {1353-1357},
}