Ann-Christin Bette, Patrick Brus, Gábor Balázs, Matthias Ludwig 0006, Alois C. Knoll. Automated Defect Inspection in Reverse Engineering of Integrated Circuits. In IEEE/CVF Winter Conference on Applications of Computer Vision, WACV 2022, Waikoloa, HI, USA, January 3-8, 2022. pages 1809-1818, IEEE, 2022. [doi]
Abstract is missing.