Kamel Beznia, Ahcène Bounceur, Louay Abdallah, Ke Huang, Salvador Mir, Reinhardt Euler. Accurate estimation of analog test metrics with extreme circuits. In 19th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2012, Seville, Spain, December 9-12, 2012. pages 272-275, IEEE, 2012. [doi]
Abstract is missing.