A Tool for Analog/RF BIST Evaluation Using Statistical Models of Circuit Parameters

Kamel Beznia, Ahcène Bounceur, Reinhardt Euler, Salvador Mir. A Tool for Analog/RF BIST Evaluation Using Statistical Models of Circuit Parameters. ACM Trans. Design Autom. Electr. Syst., 20(2):31, 2015. [doi]

Abstract

Abstract is missing.