K. Beznia, Ahcène Bounceur, Salvador Mir, Reinhardt Euler. Statistical modelling of analog circuits for test metrics computation. In Proceedings of the 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, DTIS 2013, 26-28 March, 2013, Abu Dhabi, UAE. pages 25-29, IEEE, 2013. [doi]
Abstract is missing.