Leakage minimization of nano-scale circuits in the presence of systematic and random variations

Sarvesh Bhardwaj, Sarma B. K. Vrudhula. Leakage minimization of nano-scale circuits in the presence of systematic and random variations. In William H. Joyner Jr., Grant Martin, Andrew B. Kahng, editors, Proceedings of the 42nd Design Automation Conference, DAC 2005, San Diego, CA, USA, June 13-17, 2005. pages 541-546, ACM, 2005. [doi]

Abstract

Abstract is missing.