Gaurav Bhargava, Dale Meehl, James Sage. Achieving serendipitous N-detect mark-offs in Multi-Capture-Clock scan patterns. In Jill Sibert, Janusz Rajski, editors, 2007 IEEE International Test Conference, ITC 2007, Santa Clara, California, USA, October 21-26, 2007. pages 1-7, IEEE, 2007. [doi]
Abstract is missing.