Debesh Bhatta, Ishita Mukhopadhyay, Suriyaprakash Natarajan, Prashant Goteti, Bin Xue. Framework for analog test coverage. In International Symposium on Quality Electronic Design, ISQED 2013, Santa Clara, CA, USA, March 4-6, 2013. pages 468-475, IEEE, 2013. [doi]
Abstract is missing.