LSTA: Learning-Based Static Timing Analysis for High-Dimensional Correlated On-Chip Variations

Song Bian, Michihiro Shintani, Masayuki Hiromoto, Takashi Sato. LSTA: Learning-Based Static Timing Analysis for High-Dimensional Correlated On-Chip Variations. In Proceedings of the 54th Annual Design Automation Conference, DAC 2017, Austin, TX, USA, June 18-22, 2017. ACM, 2017. [doi]

Abstract

Abstract is missing.