A Probabilistic and Constraint Based Approach for Low Power Test Generation

Hossein Sabaghian Bidgoli, Majid Namaki-Shoushtari, Zainalabedin Navabi. A Probabilistic and Constraint Based Approach for Low Power Test Generation. In 21st IEEE Asian Test Symposium, ATS 2012, Niigata, Japan, November 19-22, 2012. pages 113-118, IEEE Computer Society, 2012. [doi]

Abstract

Abstract is missing.