Rabia Bilal, W. Wang, Rupert Young. Analysis and Approach to Reduce Electrode Contact Artifacts in EIM. In David Al-Dabass, Alessandra Orsoni, Athanasios A. Pantelous, Gregorio Romero, Jesús Félez, editors, Proceedings of the UKSim 5th European Symposium on Computer Modeling and Simulation, EMS 2011, Madrid, Spain, November 16-18, 2011. pages 135-137, IEEE, 2011. [doi]
Abstract is missing.