Devansh Bisla, Anna Choromanska, Russell S. Berman, Jennifer A. Stein, David Polsky. Towards Automated Melanoma Detection With Deep Learning: Data Purification and Augmentation. In IEEE Conference on Computer Vision and Pattern Recognition Workshops, CVPR Workshops 2019, Long Beach, CA, USA, June 16-20, 2019. pages 2720-2728, Computer Vision Foundation / IEEE, 2019. [doi]
Abstract is missing.