A Novel Technique for Input Vector Compression in System-on-Chip Testing

Satyendra N. Biswas, Sunil R. Das, Mansour H. Assaf. A Novel Technique for Input Vector Compression in System-on-Chip Testing. In 2008 International Conference on Information Technology, ICIT '08, Bhubaneswar, India, December 17-20, 2008. pages 53-58, IEEE Computer Society, 2008. [doi]

@inproceedings{BiswasDA08,
  title = {A Novel Technique for Input Vector Compression in System-on-Chip Testing},
  author = {Satyendra N. Biswas and Sunil R. Das and Mansour H. Assaf},
  year = {2008},
  doi = {10.1109/ICIT.2008.47},
  url = {http://doi.ieeecomputersociety.org/10.1109/ICIT.2008.47},
  researchr = {https://researchr.org/publication/BiswasDA08},
  cites = {0},
  citedby = {0},
  pages = {53-58},
  booktitle = {2008 International Conference on Information Technology, ICIT '08, Bhubaneswar, India, December 17-20, 2008},
  publisher = {IEEE Computer Society},
  isbn = {978-1-4244-3745-0},
}