Yves Blaquière, Yvon Savaria, Jaouad El Fouladi. Digital Measurement Technique for Capacitance Variation Detection on Integrated Circuit I/Os. In 14th IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2007, Marrakech, Morocco, December 11-14, 2007. pages 42-45, IEEE, 2007. [doi]
Abstract is missing.