David Bol, Renaud Ambroise, Denis Flandre, Jean-Didier Legat. Impact of Technology Scaling on Digital Subthreshold Circuits. In IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2008, 7-9 April 2008, Montpellier, France. pages 179-184, IEEE Computer Society, 2008. [doi]
Abstract is missing.