A Single-Temperature Trimming Technique for MOS-Input Operational Amplifiers Achieving 0.33 μ V/°C Offset Drift

Muhammed Bolatkale, Michiel A. P. Pertijs, Wilko J. Kindt, Johan H. Huijsing, Kofi A. A. Makinwa. A Single-Temperature Trimming Technique for MOS-Input Operational Amplifiers Achieving 0.33 μ V/°C Offset Drift. J. Solid-State Circuits, 46(9):2099-2107, 2011. [doi]

@article{BolatkalePKHM11,
  title = {A Single-Temperature Trimming Technique for MOS-Input Operational Amplifiers Achieving 0.33 μ V/°C Offset Drift},
  author = {Muhammed Bolatkale and Michiel A. P. Pertijs and Wilko J. Kindt and Johan H. Huijsing and Kofi A. A. Makinwa},
  year = {2011},
  doi = {10.1109/JSSC.2011.2139530},
  url = {http://dx.doi.org/10.1109/JSSC.2011.2139530},
  researchr = {https://researchr.org/publication/BolatkalePKHM11},
  cites = {0},
  citedby = {0},
  journal = {J. Solid-State Circuits},
  volume = {46},
  number = {9},
  pages = {2099-2107},
}