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Measuring and Modeling MVS Under VM

Ethan D. Bolker. Measuring and Modeling MVS Under VM. In Donald R. Deese, H. Pat Artis, Bernard Domanski, John P. Pilch, Sue Felix, Sidney Finehirsh, Jason G. Shane, Gordon R. Stauffer, editors, Eleventh International Computer Measurement Group Conference, Dallas, TX, USA, December 9-13, 1985, Proceedings. pages 710-713, Computer Measurement Group, 1985.

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