LetÃcia Maria Veiras Bolzani, Moritz Fieback, Susanne Hoffmann-Eifert, Thiago Copetti, E. Brum, Stephan Menzel, Said Hamdioui, Tobias Gemmeke. Review of Manufacturing Process Defects and Their Effects on Memristive Devices. J. Electronic Testing, 37(4):427-437, 2021. [doi]
Abstract is missing.