Luciano Bonaria, Maurizio Raganato, Giovanni Squillero, Matteo Sonza Reorda. Test-Plan Optimization for Flying-Probes In-Circuit Testers. In IEEE International Test Conference in Asia, ITC-Asia 2019, Tokyo, Japan, September 3-5, 2019. pages 19-24, IEEE, 2019. [doi]
Abstract is missing.