Yannick Bonhomme, Patrick Girard, Christian Landrault, Serge Pravossoudovitch. Test Power: a Big Issue in Large SOC Designs. In 1st IEEE International Workshop on Electronic Design, Test and Applications (DELTA 2002), 29-31 January 2002, Christchurch, New Zealand. pages 447-449, IEEE Computer Society, 2002. [doi]
Abstract is missing.