An efficient scan tree design for test time reduction

Yannick Bonhomme, Tomokazu Yoneda, Hideo Fujiwara, Patrick Girard. An efficient scan tree design for test time reduction. In 9th European Test Symposium (ETS 2004), May 23-26, 2004, Ajaccio, France. pages 174-179, IEEE, 2004. [doi]

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