A generic framework for defect detection on vessel structures based on image saliency

Francisco BonnĂ­n-Pascual, Alberto Ortiz. A generic framework for defect detection on vessel structures based on image saliency. In 21st IEEE International Conference on Emerging Technologies and Factory Automation, ETFA 2016, Berlin, Germany, September 6-9, 2016. pages 1-4, IEEE, 2016. [doi]

Abstract

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