Introspection Into Reliability Aspects in AlGaN/GaN HEMTs With Gate Geometry Modification

Sushanta Bordoloi, Ashok Ray, Gaurav Trivedi. Introspection Into Reliability Aspects in AlGaN/GaN HEMTs With Gate Geometry Modification. IEEE Access, 9:99828-99841, 2021. [doi]

Abstract

Abstract is missing.