Electrical model of an NMOS body biased structure in triple-well technology under photoelectric laser stimulation

Nicolas Borrel, Clement Champeix, Mathieu Lisart, Alexandre Sarafianos, Edith Kussener, Wenceslas Rahajandraibe, Jean-Max Dutertre. Electrical model of an NMOS body biased structure in triple-well technology under photoelectric laser stimulation. In IEEE International Reliability Physics Symposium, IRPS 2015, Monterey, CA, USA, April 19-23, 2015. pages 1, IEEE, 2015. [doi]

Abstract

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