Soumitra Bose, Vishwani D. Agrawal. Estimating stuck fault coverage in sequential logic using state traversal and entropy analysis. In Jill Sibert, Janusz Rajski, editors, 2007 IEEE International Test Conference, ITC 2007, Santa Clara, California, USA, October 21-26, 2007. pages 1-10, IEEE, 2007. [doi]
Abstract is missing.