Gianni Bosi, Antonio Raffo, Giorgio Vannini, Gustavo Avolio, Dominique Schreurs. Impact of transistor model uncertainty on microwave load-pull simulations. In IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2017, Torino, Italy, May 22-25, 2017. pages 1-6, IEEE, 2017. [doi]
Abstract is missing.