An effective ATPG flow for Gate Delay Faults

Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud Virazel, Paolo Bernardi, Matteo Sonza Reorda. An effective ATPG flow for Gate Delay Faults. In 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, DTIS 2015, Napoli, Italy, April 21-23, 2015. pages 1-6, IEEE, 2015. [doi]

Abstract

Abstract is missing.