An efficient fault simulation technique for transition faults in non-scan sequential circuits

Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Paolo Bernardi, Matteo Sonza Reorda. An efficient fault simulation technique for transition faults in non-scan sequential circuits. In Proceedings of the 2009 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2009, April 15-17, 2009, Liberec, Czech Republic. pages 50-55, IEEE Computer Society, 2009. [doi]

Abstract

Abstract is missing.