Reliability assessment of FreeRTOS in Embedded Systems

Alberto Bosio, Maurizio Rebaudengo, Alessandro Savino. Reliability assessment of FreeRTOS in Embedded Systems. In 52nd Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2022, Supplemental Volume, Baltimore, MD, USA, June 27-30, 2022. pages 28-30, IEEE, 2022. [doi]

Abstract

Abstract is missing.