Sebastiàn A. Bota, Gabriel Torrens, Bartomeu Alorda, J. Verd, Jaume Segura. Cross-BIC architecture for single and multiple SEU detection enhancement in SRAM memories. In 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 5-7 July, 2010, Corfu, Greece. pages 141-146, IEEE, 2010. [doi]
Abstract is missing.