Achieving SCA Conformance Testing with Model-Based Testing

Julien Botella, Jean-Philippe Delahaye, Eddie Jaffuel, Bruno Legeard, Fabien Peureux. Achieving SCA Conformance Testing with Model-Based Testing. VLSI Signal Processing, 83(1):113-128, 2016. [doi]

@article{BotellaDJLP16,
  title = {Achieving SCA Conformance Testing with Model-Based Testing},
  author = {Julien Botella and Jean-Philippe Delahaye and Eddie Jaffuel and Bruno Legeard and Fabien Peureux},
  year = {2016},
  doi = {10.1007/s11265-015-1089-y},
  url = {http://dx.doi.org/10.1007/s11265-015-1089-y},
  researchr = {https://researchr.org/publication/BotellaDJLP16},
  cites = {0},
  citedby = {0},
  journal = {VLSI Signal Processing},
  volume = {83},
  number = {1},
  pages = {113-128},
}